The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.
The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.
Patent No.:
Date of Patent:
Feb. 19, 2013
Filed:
Apr. 24, 2008
Tetsuro Aikawa, Tokyo, JP;
Yoshinori Satoh, Tokyo, JP;
Makoto Ochiai, Tokyo, JP;
Hiroyuki Adachi, Tokyo, JP;
Tetsuro Aikawa, Tokyo, JP;
Yoshinori Satoh, Tokyo, JP;
Makoto Ochiai, Tokyo, JP;
Hiroyuki Adachi, Tokyo, JP;
Kabushiki Kaisha Toshiba, Tokyo, JP;
Abstract
Visibility of defects is improved for inspection of structures and the like, by generating an image having higher resolution than pixel resolution of a TV camera itself. An appearance inspection apparatus is provided with a TV camera; a camera driving device for making the TV camera scan an inspection object; an image capture device for capturing the image in the TV camera as a digital image; a camera motion measuring device for measuring scanning motion of the TV camera; a high definition image generating device, which generates a high definition image having a higher pixel resolution than that of the TV camera, based on the digital images captured by the image capture device and the TV camera scanning motion data measured by the camera motion measuring device; and a recording device which records and stores positional information of the inspection object.