The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.
The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.
Patent No.:
Date of Patent:
Feb. 19, 2013
Filed:
Nov. 29, 2008
Waseem Ibrahim Faidi, Schenectady, NY (US);
Changting Wang, Nisakyuna, NY (US);
Stephane Renou, Clifton Park, NY (US);
Shu Ching Quek, Clifton Park, NY (US);
Nilesh Tralshawala, Rexford, NY (US);
Aparna Chakrapani Sheila-vadde, Bangalore, IN;
Peter J. Fritz, Greenville, SC (US);
Waseem Ibrahim Faidi, Schenectady, NY (US);
Changting Wang, Nisakyuna, NY (US);
Stephane Renou, Clifton Park, NY (US);
Shu Ching Quek, Clifton Park, NY (US);
Nilesh Tralshawala, Rexford, NY (US);
Aparna Chakrapani Sheila-Vadde, Bangalore, IN;
Peter J. Fritz, Greenville, SC (US);
General Electric Company, Niskayuna, NY (US);
Abstract
A method of non-destructive testing that employs composite systems that include a curable resin and detectable particles that have a property that can be distinguished from a property of the resin is disclosed. Array probes useful in the method also are disclosed.