The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.

The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.

Date of Patent:
Feb. 19, 2013

Filed:

Sep. 02, 2008
Applicants:

George Speake, Santa Barbara, CA (US);

Nuwan Nagahawatte, Goleta, CA (US);

Richard M. Goeden, Goleta, CA (US);

Ted Takagi, Santa Maria, CA (US);

Robert Ernst, Carpinteria, CA (US);

Gary B. Hughes, Santa Maria, CA (US);

Joseph Kostrzewa, Buellton, CA (US);

John Graff, Santa Barbara, CA (US);

Russell Granneman, Goleta, CA (US);

Michael Kent, Goleta, CA (US);

Neela Nalam, Goleta, CA (US);

Stephen Lyon, Goleta, CA (US);

Barbara Sharp, Santa Barbara, CA (US);

Pierre Boulanger, Goleta, CA (US);

Neil Cutcliffe, Goleta, CA (US);

Tim Martin, Santa Barbara, CA (US);

Ted Hoelter, Goleta, CA (US);

Inventors:

George Speake, Santa Barbara, CA (US);

Nuwan Nagahawatte, Goleta, CA (US);

Richard M. Goeden, Goleta, CA (US);

Ted Takagi, Santa Maria, CA (US);

Robert Ernst, Carpinteria, CA (US);

Gary B. Hughes, Santa Maria, CA (US);

Joseph Kostrzewa, Buellton, CA (US);

John Graff, Santa Barbara, CA (US);

Russell Granneman, Goleta, CA (US);

Michael Kent, Goleta, CA (US);

Neela Nalam, Goleta, CA (US);

Stephen Lyon, Goleta, CA (US);

Barbara Sharp, Santa Barbara, CA (US);

Pierre Boulanger, Goleta, CA (US);

Neil Cutcliffe, Goleta, CA (US);

Tim Martin, Santa Barbara, CA (US);

Ted Hoelter, Goleta, CA (US);

Assignee:

Flir Systems, Inc., Wilsonville, OR (US);

Attorney:
Primary Examiner:
Assistant Examiner:
Int. Cl.
CPC ...
G01J 5/22 (2006.01);
U.S. Cl.
CPC ...
Abstract

Systems and methods directed to calibration techniques for infrared cameras are disclosed for some embodiments. For example, a method of determining infrared sensor calibration information, in accordance with an embodiment, includes performing a calibration operation on an infrared sensor to obtain calibration information, wherein the infrared sensor is not within an infrared camera core, and storing the calibration information.


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