The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.

The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.

Patent No.:

US 8377804 B1

PDF
Full Text
Expired
Date of Patent:
Feb. 19, 2013

Filed:

Sep. 29, 2009
Applicants:

Junpei Momo, Sagamihara, JP;

Kosei Nei, Atsugi, JP;

Hiroaki Honda, Atsugi, JP;

Masaki Koyama, Atsugi, JP;

Akihisa Shimomura, Atsugi, JP;

Inventors:

Junpei Momo, Sagamihara, JP;

Kosei Nei, Atsugi, JP;

Hiroaki Honda, Atsugi, JP;

Masaki Koyama, Atsugi, JP;

Akihisa Shimomura, Atsugi, JP;

Assignee:

Semiconductor Energy Laboratory Co., Ltd., Atsugi-shi, Kanagawa-ken, JP;

Attorneys:
Primary Examiner:
Assistant Examiner:
Int. Cl.
CPC ...
H01L 21/20 (2006.01); H01L 21/30 (2006.01);
U.S. Cl.
CPC ...
Abstract

To provide a semiconductor substrate in which a semiconductor element having favorable crystallinity and high performance can be formed. A single crystal semiconductor substrate having an embrittlement layer and a base substrate are bonded with an insulating layer interposed therebetween; the single crystal semiconductor substrate is separated along the embrittlement layer by heat treatment; a single crystal semiconductor layer is fixed to the base substrate; the single crystal semiconductor layer is irradiated with a laser beam; the single crystal semiconductor layer is in a partially melted state to be recrystallized; and crystal defects are repaired. In addition, the energy density of a laser beam with which the best crystallinity of the single crystal semiconductor layer is obtained is detected by a microwave photoconductivity decay method.


Find Patent Forward Citations

Momo, Junpei. (2013). Manufacturing method of semiconductor substrate and semiconductor device (U.S. Patent No. 8377804). U.S. Patent and Trademark Office. https://idiyas.com/patent/badge/8377804

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