The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.

The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.

Date of Patent:
Feb. 19, 2013

Filed:

Oct. 27, 2010
Applicants:

John Christianson, Waukesha, WI (US);

Charles D. Kim, Raleigh, NC (US);

Inventors:

John Christianson, Waukesha, WI (US);

Charles D. Kim, Raleigh, NC (US);

Assignee:

Empire Level Mfg. Corp., Mukwonago, WI (US);

Attorney:
Primary Examiner:
Int. Cl.
CPC ...
G01C 9/02 (2006.01);
U.S. Cl.
CPC ...
Abstract

A level including an elongate hollow frame with two sidewalls and a topwall extending therebetween. A topnotch is formed by removal of a topwall section and adjacent sections of sidewalls including notch-defining bottom and side edges. A central vial is within the topnotch. The frame includes an inner horizontal wall extending between the sidewalls at the notch-defining bottom edges. A central-vial reference surface is formed in the inner horizontal wall parallel to the top and bottom measuring surfaces and defining a notch-bottom. The central vial is supported against the central-vial reference surface in accurate orientation without calibration. The central vial is secured with respect to the inner horizontal wall by mechanical fasteners. The frame further preferably includes an integral inner vertical wall extending between the top and bottom walls thereby reinforcing the frame along the frame length.


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