The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.
The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.
Patent No.:
Date of Patent:
Feb. 12, 2013
Filed:
Mar. 09, 2007
Nathan D. Tuck, Corvallis, OR (US);
Matthew N. Papakipos, Palo Alto, CA (US);
Brian K. Grant, Cupertino, CA (US);
Christopher G. Demetriou, Redwood City, CA (US);
Jan Civlin, Sunnyvale, CA (US);
Nathan D. Tuck, Corvallis, OR (US);
Matthew N. Papakipos, Palo Alto, CA (US);
Brian K. Grant, Cupertino, CA (US);
Christopher G. Demetriou, Redwood City, CA (US);
Jan Civlin, Sunnyvale, CA (US);
Google Inc., Mountain View, CA (US);
Abstract
A runtime system implemented in accordance with the present invention provides an application platform for parallel-processing computer systems. Such a runtime system enables users to leverage the computational power of the parallel-processing computer systems to accelerate/optimize numeric and array-intensive computations in their application programs. A profiling tool is used to collect, analyze, and visualize the performance data of an application in connection with its execution on a parallel-processing computer system through the runtime system. This profiling tool greatly enhances an application developer's ability to understand how an application is executed on the parallel-processing computer system and fine-tune the application to achieve high performance.