The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.
The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.
Patent No.:
Date of Patent:
Feb. 12, 2013
Filed:
Jun. 12, 2010
Applicants:
Xi Zhou, Champaign, IL (US);
Jinjun Wang, San Jose, CA (US);
Fengjun LV, San Jose, CA (US);
Kai Yu, Santa Clara, CA (US);
Inventors:
Xi Zhou, Champaign, IL (US);
Jinjun Wang, San Jose, CA (US);
Fengjun Lv, San Jose, CA (US);
Kai Yu, Santa Clara, CA (US);
Assignee:
NEC Laboratories America, Inc., Princeton, NJ (US);
Attorneys:
Primary Examiner:
Int. Cl.
CPC ...
G06F 15/18 (2006.01);
U.S. Cl.
CPC ...
Abstract
Systems and methods are disclosed to perform image parsing on one or more images by identifying a set of similar regions from each image; assigning one or more region labels to each region and generating multiple hypotheses for region label assignment; and detecting class, location and boundary of each object in the image, wherein object classification, detection and segmentation are performed jointly during image parsing.