The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.
The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.
Patent No.:
Date of Patent:
Feb. 12, 2013
Filed:
Aug. 04, 2009
Jeom Ja Kang, Daejeon, KR;
Yunkeun Lee, Daejeon, KR;
Jeon Gue Park, Daejeon, KR;
Ho-young Jung, Daejeon, KR;
Hyung-bae Jeon, Daejeon, KR;
Hoon Chung, Daejeon, KR;
Sung Joo Lee, Daejeon, KR;
Euisok Chung, Daejeon, KR;
Ji Hyun Wang, Daejeon, KR;
Byung OK Kang, Daejeon, KR;
Ki-young Park, Daejeon, KR;
Jong Jin Kim, Daejeon, KR;
Jeom Ja Kang, Daejeon, KR;
Yunkeun Lee, Daejeon, KR;
Jeon Gue Park, Daejeon, KR;
Ho-Young Jung, Daejeon, KR;
Hyung-Bae Jeon, Daejeon, KR;
Hoon Chung, Daejeon, KR;
Sung Joo Lee, Daejeon, KR;
Euisok Chung, Daejeon, KR;
Ji Hyun Wang, Daejeon, KR;
Byung Ok Kang, Daejeon, KR;
Ki-young Park, Daejeon, KR;
Jong Jin Kim, Daejeon, KR;
Electronics and Telecommunications Research Institute, Daejeon, KR;
Abstract
An utterance verification method for an isolated word N-best speech recognition result includes: calculating log likelihoods of a context-dependent phoneme and an anti-phoneme model based on an N-best speech recognition result for an input utterance; measuring a confidence score of an N-best speech-recognized word using the log likelihoods; calculating distance between phonemes for the N-best speech-recognized word; comparing the confidence score with a threshold and the distance with a predetermined mean of distances; and accepting the N-best speech-recognized word when the compared results for the confidence score and the distance correspond to acceptance.