The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.
The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.
Patent No.:
Date of Patent:
Feb. 12, 2013
Filed:
Feb. 22, 2010
Georg Schmidt, Laichingen, DE;
Markus Hilsenbeck, Beimerstetten, DE;
Maik Riegler, Blaustein, DE;
Ubidyne, Inc., Wilmington, DE (US);
Abstract
The present disclosure teaches a calibration system, a calibration apparatus and a method for calibrating a signal path and a method for calibrating a delay. The calibration system comprises an injector, a calibration signal generator, a correlator, a detector unit, a polygon former and a pattern classifier unit. The calibration system is adapted to calculate a fraction of a delay from a set of polygons. The delay is being accumulated along a signal path. The fraction of the delay is indicative of an accuracy of the delay at a fine sampling rate as if the delay was measured at the fine sampling rate being an integer multiple of the coarse sampling rate. The method for calibrating of the signal path uses a calibration signal sampled at a coarse sampling rate. Correlation techniques are used in order to detect a fraction of the delay from a set of polygons.