The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.
The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.
Patent No.:
Date of Patent:
Feb. 12, 2013
Filed:
Nov. 16, 2009
Genady Grabarnik, Scarsdale, NY (US);
Yefim H. Michlin, Nesher, IL;
Larisa Shwartz, Scarsdale, NY (US);
Genady Grabarnik, Scarsdale, NY (US);
Yefim H. Michlin, Nesher, IL;
Larisa Shwartz, Scarsdale, NY (US);
International Business Machines Corporation, Armonk, NY (US);
Abstract
Test characteristics are determined at vertices of a rectangle defined on a sequential probability ratio test plot of a number of failures of a new physical system versus a number of failures of a baseline physical system. Based on the test characteristics, errors of first and second order are approximated as planes. Based on the approximating, intercepts of accept and reject boundaries are estimated. Based on slopes of the planes and actual values of the errors of the first and second orders, a starting point is determined on a graph of values of an intercept of the reject boundary and values of an intercept of the accept boundary. A minimum of an operating characteristic function is determined by alternative advances, commencing at the starting point, parallel to an axis representing the accept boundary intercept and an axis representing the reject boundary intercept.