The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.
The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.
Patent No.:
Date of Patent:
Feb. 12, 2013
Filed:
Apr. 28, 2010
Justin Gregg, San Francisco, CA (US);
Tomoki Takeya, Santa Clara, CA (US);
Adil Syed, Santa Clara, CA (US);
Justin Gregg, San Francisco, CA (US);
Tomoki Takeya, Santa Clara, CA (US);
Adil Syed, Santa Clara, CA (US);
Apple Inc., Cupertino, CA (US);
Abstract
A test system may include multiple test stations. Electronic devices may be tested using the test system. Each test station may include a test unit such as a radio-frequency tester that can make wireless and wired radio-frequency signal measurements on devices under test. The test stations may be configured to perform pass-fail testing on devices under test during manufacturing. One or more selected devices under test that have passed the pass-fail tests may be retested using the test stations. Multiple tests may be performed at a given test station using the same selected device under test. Gathered test data may be analyzed to determine whether the test stations have sufficient accuracy and precision or need to be recalibrated or taken offline.