The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.

The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.

Date of Patent:
Feb. 12, 2013

Filed:

Sep. 18, 2009
Applicants:

Jeffrey C. Hudson, Snohomish, WA (US);

Nathaniel J. Wetzel, Seattle, WA (US);

Glen Howard Vetter, Stanwood, WA (US);

Inventors:

Jeffrey C. Hudson, Snohomish, WA (US);

Nathaniel J. Wetzel, Seattle, WA (US);

Glen Howard Vetter, Stanwood, WA (US);

Assignee:

Fluke Corporation, Everett, WA (US);

Attorney:
Primary Examiner:
Int. Cl.
CPC ...
H04B 10/00 (2006.01);
U.S. Cl.
CPC ...
Abstract

An electrical test instrument comprising a base unit having a first communication address. A remote display unit separate from the base unit and having a second communication address is also provided. Communication circuitry is operative to provide electrical communication in a first RF mode between the base unit and the remote display unit as a bound communication pair based on the first and second communication addresses. The communication circuitry is further operative to operate selectively in a second secure communication mode. The first and second communication addresses are exchanged in the second secure communication mode to establish the bound communication pair for subsequent communication in the first RF mode. In some exemplary embodiments, the second communication mode is an optical communication mode (e.g., an IR communication mode).


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