The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.
The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.
Patent No.:
Date of Patent:
Feb. 12, 2013
Filed:
Nov. 10, 2010
Eric P. Lam, Diamond Bar, CA (US);
Christopher A. Leddy, Huntington Beach, CA (US);
Stephen R. Nash, Playa Del Rey, CA (US);
Harrison A. Parks, Los Angeles, CA (US);
Eric P. Lam, Diamond Bar, CA (US);
Christopher A. Leddy, Huntington Beach, CA (US);
Stephen R. Nash, Playa Del Rey, CA (US);
Harrison A. Parks, Los Angeles, CA (US);
Raytheon Company, Waltham, MA (US);
Abstract
The technology described herein includes integration of image frames. The integration of image frames includes determining a sharpness metric for each image frame in a plurality of image frames. The sharpness metric is indicative of at least one of edge content and an edge size of the image frame. The integration of image frames further includes determining a noise metric for each image frame in the plurality of image frames. The noise metric is indicative of a variation in brightness or color in the image frame. The integration of image frames further includes determining a jitter metric for each image frame in the plurality of image frames. The jitter metric is indicative of spatial shifts between the image frame and other image frames in the plurality of image frames. The integration of image frames further includes generating an integrated image frame from one or more of the plurality of image frames based on the sharpness metric, the noise metric, and the jitter metric.