The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.
The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.
Patent No.:
Date of Patent:
Feb. 12, 2013
Filed:
Jan. 13, 2010
Tilman Donath, Brugg, CH;
Martin Hoheisel, Erlangen, DE;
Christian David, Lauchringen, DE;
Eckhard Hempel, Fürth, DE;
Franz Pfeiffer, Garching, DE;
Stefan Popescu, Erlangen, DE;
Tilman Donath, Brugg, CH;
Martin Hoheisel, Erlangen, DE;
Christian David, Lauchringen, DE;
Eckhard Hempel, Fürth, DE;
Franz Pfeiffer, Garching, DE;
Stefan Popescu, Erlangen, DE;
Siemens Aktiengesellschaft, Munich, DE;
Paul Scherrer Institut, Villigen, PSI, CH;
Abstract
An arrangement and a method are disclosed for projective and/or tomographic phase-contrast imaging using X-ray radiation. In at least one embodiment, one or more phase grids is/are arranged in the beam path such that during a rotation of the at least one X-ray source, the examination object is scanned with different spatial orientations of the grid lines relative to the examination object such that the complete refraction angle, and hence the complete phase shift gradient, can be determined for each X-ray beam from the two scans with differently oriented phase grids in order to be able to show the phase shift of an examination object in terms of projections or in a tomographic image.