The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.
The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.
Patent No.:
Date of Patent:
Feb. 12, 2013
Filed:
Jan. 10, 2009
Jong Hyeon Park, San Jose, CA (US);
Matthias Brehler, Boulder, CO (US);
Brian Clarke Banister, San Diego, CA (US);
Albert Van Zelst, Woerden, NL;
Tae Ryun Chang, Santa Clara, CA (US);
Vincent K. Jones, Redwood City, CA (US);
Je Woo Kim, Cupertino, CA (US);
Jong Hyeon Park, San Jose, CA (US);
Matthias Brehler, Boulder, CO (US);
Brian Clarke Banister, San Diego, CA (US);
Albert van Zelst, Woerden, NL;
Tae Ryun Chang, Santa Clara, CA (US);
Vincent K. Jones, Redwood City, CA (US);
Je Woo Kim, Cupertino, CA (US);
QUALCOMM Incorporated, San Diego, CA (US);
Abstract
Certain embodiments of the present disclosure provide techniques for approximate computation of lnorms as a part of the maximum likelihood (ML) detection: tri-maxmin, maxsum and sortsum algorithms. The proposed approximation schemes show better accuracy than conventional approximation schemes—the abssum and maxmin algorithms, while the computational complexity is very similar. The error rate performance of the ML detection that utilizes proposed norm-approximation techniques are very close to the reference ML detection with exact calculation of lnorms, while the computational complexity is significantly smaller.