The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.

The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.

Date of Patent:
Feb. 12, 2013

Filed:

Feb. 23, 2009
Applicant:

VU L. Nguyen, Goleta, CA (US);

Inventor:

Vu L. Nguyen, Goleta, CA (US);

Assignee:

Flir Systems, Inc., Wilsonville, OR (US);

Attorney:
Primary Examiner:
Assistant Examiner:
Int. Cl.
CPC ...
H04N 5/232 (2006.01);
U.S. Cl.
CPC ...
Abstract

Various techniques are provided to perform flat field correction for infrared cameras. In one example, a method of calibrating an infrared camera includes calibrating a focal plane array (FPA) of the infrared camera to an external scene to determine a set of flat field correction values associated with a first optical path from the external scene to the FPA. The method also includes calibrating the FPA to a shutter of the infrared camera to determine a set of flat field correction values associated with a second optical path from the shutter to the FPA. The method also includes using the flat field correction values associated with the first and second optical paths to calculate a set of supplemental flat field correction values to apply to thermal image data obtained with the infrared camera. The method also includes storing the supplemental flat field correction values.


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