The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.

The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.

Date of Patent:
Feb. 12, 2013

Filed:

Mar. 18, 2010
Applicant:

Hiroomi Nakajima, Kanagawa, JP;

Inventor:

Hiroomi Nakajima, Kanagawa, JP;

Assignee:
Attorney:
Primary Examiner:
Assistant Examiner:
Int. Cl.
CPC ...
H01L 23/544 (2006.01);
U.S. Cl.
CPC ...
Abstract

An alignment mark formed by using a first mask used in forming a same memory cell pattern on a substrate and formed together with the memory cell pattern includes: a first pattern for position detection used for alignment in forming a first wiring pattern; and a first irregular reflection prevention mark that suppresses, when a position detection signal is irradiated as alignment in forming a second wiring pattern further on an upper layer side than the first wiring pattern, irregular reflection of a position detection signal from a second pattern for position detection formed further in a lower layer than the first pattern for position detection.


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