The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.

The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.

Date of Patent:
Feb. 12, 2013

Filed:

Aug. 16, 2012
Applicants:

Manabu Teshigawara, Otawara, JP;

Takuzo Takayama, Utsunomiya, JP;

Yuuji Yanagida, Otawara, JP;

Takaya Umehara, Kuki, JP;

Inventors:

Manabu Teshigawara, Otawara, JP;

Takuzo Takayama, Utsunomiya, JP;

Yuuji Yanagida, Otawara, JP;

Takaya Umehara, Kuki, JP;

Assignees:
Attorney:
Primary Examiner:
Int. Cl.
CPC ...
G01T 1/164 (2006.01);
U.S. Cl.
CPC ...
Abstract

A PET apparatus includes an optical coupling detachment testing unit. In one example, the optical coupling detachment testing unit inputs an electric signal to a piezoelectric element or the like adhered to a detector module and generates a sound wave within the detector module. Further, the optical coupling detachment testing unit detects the sound wave propagated within the detector module and performs a frequency analysis on the detected sound wave. Subsequently, as a result of the analysis, the optical coupling detachment testing unit detects whether an optical coupling detachment has occurred by looking for a frequency distribution specific to a surface having an optical coupling detachment and/or comparing a frequency distribution with another frequency distribution from a previous test.


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