The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.

The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.

Date of Patent:
Feb. 12, 2013

Filed:

Jul. 01, 2010
Applicants:

Kenji Tanaka, Tokyo, JP;

Lyang-ja Lee, Tokyo, JP;

Koji Munechika, Tokyo, JP;

Hisashi Arikuni, Takarazuka, JP;

Bungo Ochiai, Yonezawa, JP;

Inventors:

Kenji Tanaka, Tokyo, JP;

Lyang-ja Lee, Tokyo, JP;

Koji Munechika, Tokyo, JP;

Hisashi Arikuni, Takarazuka, JP;

Bungo Ochiai, Yonezawa, JP;

Assignee:

Protosera Inc., Tokyo, JP;

Attorney:
Primary Examiner:
Int. Cl.
CPC ...
G01N 24/00 (2006.01); G01N 1/00 (2006.01); G01N 33/53 (2006.01); G01N 3/02 (2006.01); C12Q 1/68 (2006.01); B01L 9/00 (2006.01);
U.S. Cl.
CPC ...
Abstract

The present invention provides a plate for mass spectrometry comprising a support and a PVDF-containing coating (that is, a PVDF-deposited thin layer) thereon, and a method of preparing a plate for mass spectrometry, which comprises coating the support surface with PVDF. The present invention also provides a method of analyte identification comprising subjecting an analyte-containing sample to gel electrophoresis to separate the analyte, blotting the separated analyte from the gel to the above-described plate for mass spectrometry, and subjecting the plate to mass spectrometry, whereby the transferred analyte is analyzed.


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