The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.
The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.
Patent No.:
Date of Patent:
Feb. 05, 2013
Filed:
Jun. 01, 2011
Mark Grechanik, Chicago, IL (US);
Kevin M. Conroy, Evanston, IL (US);
Matthew Hellige, Chicago, IL (US);
Edy S Liongosari, Wheeling, IL (US);
Qing Xie, Chicago, IL (US);
Mark Grechanik, Chicago, IL (US);
Kevin M. Conroy, Evanston, IL (US);
Matthew Hellige, Chicago, IL (US);
Edy S Liongosari, Wheeling, IL (US);
Qing Xie, Chicago, IL (US);
Accenture Global Services Limited, Dublin, IE;
Abstract
A system for application reference testing (SMART) solves the technical problem of generating test data and test cases from graphical user interface applications (GAPs) to test web services, effectively and non-invasively. SMART allows organizations to easily and promptly identify and resolve software bugs, ensure higher quality software and development productivity, complete software projects faster, deliver software products to market quicker, and improve the return on investment for software development projects. SMART provides a user friendly visualization mechanism that interacts with an accessibility layer to enable organizations to economically and easily define user interactions with GAPs, by performing point-and-click, drag-and-drop operations on the GAPs, and generate reusable test data and test cases for web services.