The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.

The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.

Date of Patent:
Feb. 05, 2013

Filed:

Sep. 07, 2004
Applicants:

Gregg Bernard Lesartre, Ft. Collins, CO (US);

Craig William Warner, Addison, TX (US);

Tyler Johnson, Plano, TX (US);

Inventors:

Gregg Bernard Lesartre, Ft. Collins, CO (US);

Craig William Warner, Addison, TX (US);

Tyler Johnson, Plano, TX (US);

Assignee:
Attorney:
Primary Examiner:
Int. Cl.
CPC ...
G06F 15/173 (2006.01);
U.S. Cl.
CPC ...
Abstract

A method, system, and apparatus for testing a scalable computer system is provided. In an illustrative implementation, a system for testing a scalable computer system includes configuring a single cell on a partitionable system to create an isolated test channel. A test packet is generated and provided to the test channel. The test channel inserts the test packet into the scalable computer system via a communications link, and a response to the insertion of the test packet is monitored to determine system performance.


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