The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.

The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.

Date of Patent:
Feb. 05, 2013

Filed:

Dec. 30, 2009
Applicants:

Daniel M. Goldman, Des Moines, IA (US);

James L. Hunter, Littleton, CO (US);

Timothy P. Meyer, Des Moines, IA (US);

Inventors:

Daniel M. Goldman, Des Moines, IA (US);

James L. Hunter, Littleton, CO (US);

Timothy P. Meyer, Des Moines, IA (US);

Assignee:
Attorney:
Primary Examiner:
Int. Cl.
CPC ...
G01N 33/48 (2006.01);
U.S. Cl.
CPC ...
Abstract

A method and apparatus for dimensionally characterizing a target structure. In an example of the apparatus, the apparatus has a pole having a bottom end and a top end, an indicator system adapted to apprise an operator of the position of a dimension determination system relative to the target structure, and a measurement system adapted to apprise the operator of a dimension of one or more features of the target structure. In another example, the method includes taking a pole having a bottom and top end with a height determination system, a height indicator system and a height measurement system, orienting the pole relative to the plant structure, raising the height determination system to the height of the target plant structure, and determining the height of the target plant structure.


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