The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.

The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.

Date of Patent:
Feb. 05, 2013

Filed:

Dec. 18, 2009
Applicants:

Naoya Kagawa, Kariya, JP;

Tetsuya Sato, Anjo, JP;

Inventors:

Naoya Kagawa, Kariya, JP;

Tetsuya Sato, Anjo, JP;

Assignee:
Attorney:
Primary Examiner:
Assistant Examiner:
Int. Cl.
CPC ...
G06F 19/00 (2006.01);
U.S. Cl.
CPC ...
Abstract

A calibrating technique is provided for the position/attitude or only the position of an arm tip of a robot, such as an articulated type of robot. At plural positions, respective n pieces of errors (Δφ, wherein n is a positive integer larger than a value obtained by dividing the number of unknown parameters by 6 or 3) are calculated. Each error is a difference between a position of the arm tip measured and a position commanded by control. An inter-error difference (Δε(1≦y≦n−1)) between a reference error (Δφ(1≦m≦n)) arbitrarily selected from the n-piece errors (Δφ) and other errors (Δφ(x≦n, except for m)) other than the reference error (Δφ) is calculated. A parameter, which is a basis for calculating the inter-error differences (Δε), is made to converge until a sum of absolute values of the inter-error differences (Δε) becomes within a given threshold (ε(ε>0)).


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