The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.

The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.

Date of Patent:
Feb. 05, 2013

Filed:

Mar. 25, 2008
Applicants:

Ali Can, Troy, NY (US);

Michael John Gerdes, Albany, NY (US);

Xiaodong Tao, Niskayuna, NY (US);

Musodiq Olatayo Bello, Niskayuna, NY (US);

Maximilian Seel, Boston, MA (US);

Inventors:

Ali Can, Troy, NY (US);

Michael John Gerdes, Albany, NY (US);

Xiaodong Tao, Niskayuna, NY (US);

Musodiq Olatayo Bello, Niskayuna, NY (US);

Maximilian Seel, Boston, MA (US);

Assignee:

General Electric Company, Niskayuna, NY (US);

Attorney:
Primary Examiner:
Assistant Examiner:
Int. Cl.
CPC ...
G06K 9/36 (2006.01); G06K 9/62 (2006.01);
U.S. Cl.
CPC ...
Abstract

The present techniques provide systems and methods for registering images of tissue spots on a tissue microarray (TMA). In studies involving multiple biomarkers being studied on the same TMA, the TMA slide is removed from the microscope, stained, and then imaged, often multiple times. The present techniques relate to validation of the registration of the acquired images of the same TMA. An automatic approach to register the images and detect registration failures as provided herein may enhance the rapid analysis of the tissues. Artifacts such as tissue folding and tissue loss are also determined automatically.


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