The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.
The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.
Patent No.:
Date of Patent:
Feb. 05, 2013
Filed:
Oct. 01, 2009
Cynthia B. Perz, Huntington Beach, CA (US);
Jose DE LA Torre-bueno, Encinitas, CA (US);
Robert T. Ellis, Dana Point, CA (US);
Gina Marie Mclaren, Laguna Niguel, CA (US);
Mary Jean Smith, Solana Beach, CA (US);
Cynthia B. Perz, Huntington Beach, CA (US);
Jose De La Torre-Bueno, Encinitas, CA (US);
Robert T. Ellis, Dana Point, CA (US);
Gina Marie McLaren, Laguna Niguel, CA (US);
Mary Jean Smith, Solana Beach, CA (US);
Carl Zeiss Microimaging GmbH, Jena, DE;
Abstract
Systems and techniques to acquire image data. In general, in one implementation, the technique includes: acquiring image data for a plurality of areas of a scan region. The technique may further include processing the image data to determine whether an area includes one or more desired features. The technique may further include designating an area as 'interesting' if it includes a desired feature, and designating an area as non-interesting if it does not include the desired feature. The areas may be sub-divided one or more times, and subdivisions may be analyzed to determine if they include a desired feature.