The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.
The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.
Patent No.:
Date of Patent:
Feb. 05, 2013
Filed:
Dec. 22, 2006
Thomas Eldred Lambdin, Auburn, NY (US);
Bradford Morse, Syracuse, NY (US);
Clark A. Bendall, Syracuse, NY (US);
Edward B. Hubben, Skaneateles, NY (US);
Thomas W. Karpen, Skaneateles, NY (US);
Bruce A. Pellegrino, Far Hills, NJ (US);
Thomas Eldred Lambdin, Auburn, NY (US);
Bradford Morse, Syracuse, NY (US);
Clark A. Bendall, Syracuse, NY (US);
Edward B. Hubben, Skaneateles, NY (US);
Thomas W. Karpen, Skaneateles, NY (US);
Bruce A. Pellegrino, Far Hills, NJ (US);
GE Inspection Technologies LP, Schenectady, NY (US);
Abstract
An inspection apparatus can be operated to collect files during performance of an inspection. An inspection apparatus can associate metadata to a collected file. In one embodiment metadata associated with a collected file can include an article identifier. In one embodiment metadata that is associated with a collected file can include data input into an inspection apparatus by an inspector. In one embodiment metadata that is associated with a collected media file can include sensor output data. An inspection apparatus in one embodiment can include an application guiding an inspector in the performance of an inspection.