The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.

The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.

Date of Patent:
Feb. 05, 2013

Filed:

Jan. 05, 2007
Applicants:

Yefim-haim Fefer, Petah Tikva, IL;

Mikhail Bourgart, Modiin, IL;

Segey Sofer, Reshon Letzion, IL;

Yoav Weizman, Kfar-Vitkin, IL;

Inventors:

Yefim-Haim Fefer, Petah Tikva, IL;

Mikhail Bourgart, Modiin, IL;

Segey Sofer, Reshon Letzion, IL;

Yoav Weizman, Kfar-Vitkin, IL;

Assignee:
Attorney:
Primary Examiner:
Assistant Examiner:
Int. Cl.
CPC ...
H03L 7/06 (2006.01); H03K 3/00 (2006.01); G01R 31/28 (2006.01);
U.S. Cl.
CPC ...
Abstract

A device and a method for testing a variable digital delay line that includes multiple taps. The method includes providing, an input signal to the variable digital delay line and finding, for each tap out of a group of tested taps of the variable digital delay line, a variable delay unit configuration that provides a delay that is closest to a delay introduced by the tap; wherein the variable digital delay line and the variable delay unit belong to the same integrated circuit.


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