The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.
The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.
Patent No.:
Date of Patent:
Feb. 05, 2013
Filed:
Nov. 02, 2004
Applicant:
Tohru Ishibashi, Tokyo, JP;
Inventor:
Tohru Ishibashi, Tokyo, JP;
Assignee:
Canon Kabushiki Kaisha, Tokyo, JP;
Attorney:
Primary Examiner:
Int. Cl.
CPC ...
C12Q 1/68 (2006.01); C12P 19/34 (2006.01); C12M 1/34 (2006.01); C07H 21/02 (2006.01); C07H 21/04 (2006.01);
U.S. Cl.
CPC ...
Abstract
A probe-bearing substrate in which a probe capable of specifically binding to a target substance is immobilized on a substrate, characterized in that the probe-bearing substrate further includes a device for detecting an environmental change that may cause a change in the probe-bearing substrate such as probe deterioration or change in a substrate-protecting member.
Ishibashi, Tohru. (2013). Method for judging change in probe-bearing substrate, probe-bearing substrate and detecting apparatus (U.S. Patent No. 8367324). U.S. Patent and Trademark Office. https://idiyas.com/patent/badge/8367324
Data source: USPTO (United States Patent and Trademark Office) public patent records. Weekly synchronization. How IDiyas builds this profile