The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.

The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.

Date of Patent:
Feb. 05, 2013

Filed:

May. 31, 2009
Applicants:

Richard Walter Heley, Palo Alto, CA (US);

Erming Luo, Cupertino, CA (US);

Adam Mittleman, San Francisco, CA (US);

John Payne, San Jose, CA (US);

Tang Yew Tan, San Francisco, CA (US);

Erik Wang, Redwood City, CA (US);

Inventors:

Richard Walter Heley, Palo Alto, CA (US);

Erming Luo, Cupertino, CA (US);

Adam Mittleman, San Francisco, CA (US);

John Payne, San Jose, CA (US);

Tang Yew Tan, San Francisco, CA (US);

Erik Wang, Redwood City, CA (US);

Assignee:

Apple Inc., Cupertino, CA (US);

Attorney:
Primary Examiner:
Int. Cl.
CPC ...
G03F 7/20 (2006.01); G03F 7/24 (2006.01);
U.S. Cl.
CPC ...
Abstract

Techniques or processes for providing markings on products are disclosed. The markings provided on products can be textual and/or graphic. The techniques or processes can provide high resolution markings on surfaces that are flat or curved. In one embodiment, the products have housings and the markings are to be provided on the housings. For example, the housing for a particular product can include an outer housing surface and the markings can be provided on the outer housing surface.


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