The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.

The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.

Patent No.:

US 8367000 B1

PDF
Full Text
Expired
Date of Patent:
Feb. 05, 2013

Filed:

Dec. 21, 2006
Applicants:

Takakazu Yano, Tokyo, JP;

Tadahiro Fukuda, Tokyo, JP;

Miharu Sugiura, Tokorozawa, JP;

Hiroyuki Sato, Fussa, JP;

Inventors:

Takakazu Yano, Tokyo, JP;

Tadahiro Fukuda, Tokyo, JP;

Miharu Sugiura, Tokorozawa, JP;

Hiroyuki Sato, Fussa, JP;

Assignee:
Attorney:
Primary Examiner:
Int. Cl.
CPC ...
G01N 33/00 (2006.01);
U.S. Cl.
CPC ...
Abstract

An object of the invention is to provide a cassette and a measuring apparatus that can filter a sample for the optical measurement of an optically active substance and clean a sample flow channel by using a simple configuration. More specifically, the invention is directed to a cassette which includes a filter for filtering out a measurement interfering component from a sample, a container containing the filter, a cleaning liquid or cleaning agent for cleaning a sample flow channel, and a storage tank for storing the cleaning liquid or cleaning agent, and to a measuring apparatus having such a cassette.


Find Patent Forward Citations

Yano, Takakazu. (2013). Cassette and measuring apparatus (U.S. Patent No. 8367000). U.S. Patent and Trademark Office. https://idiyas.com/patent/badge/8367000

Data source: USPTO (United States Patent and Trademark Office) public patent records. Weekly synchronization. How IDiyas builds this profile

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