The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.
The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.
Patent No.:
Date of Patent:
Feb. 05, 2013
Filed:
Apr. 30, 2009
Jaume Pujol Ramo, Barcelona, ES;
Sergio Oscar Luque, Barcelona, ES;
Mikel Aldaba Arévalo, Barcelona, ES;
Jaume Pujol Ramo, Barcelona, ES;
Sergio Oscar Luque, Barcelona, ES;
Mikel Aldaba Arévalo, Barcelona, ES;
Universitat Politecnica de Catalunya, Barcelona, ES;
Abstract
The invention relates to a method and system for the objective measurement of ocular accommodation. A double-pass ophthalmoscopic system is used which incorporates a periscope allowing the patient to binocularly see real objects in an open field and images of the retinal plane to be recorded on a CCD camera. The method includes obtaining, for different values of accommodation stimulation, a set of retinal images corresponding to different focal values in the retina, obtaining the different focal positions in the retina by moving the two lenses incorporated in the ophthalmoscopic system. The image with the best optical quality is obtained for each set of images and by associating the selected image with the known value of the accommodation stimulation it is possible to objectively measure the accommodation.