The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.
The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.
Patent No.:
Date of Patent:
Jan. 29, 2013
Filed:
Jan. 20, 2009
Wilson Chan, San Mateo, CA (US);
Angelo Pruscino, Los Altos, CA (US);
Ahmed S. Abbas, Tracy, CA (US);
Tak Fung Wang, Redwood City, CA (US);
Wilson Chan, San Mateo, CA (US);
Angelo Pruscino, Los Altos, CA (US);
Ahmed S. Abbas, Tracy, CA (US);
Tak Fung Wang, Redwood City, CA (US);
Oracle International Corporation, Redwood Shores, CA (US);
Abstract
Measuring processes are started at a plurality of priority levels. A different one of the measuring processes is started for each of the priority levels. Subsequently, for each of the measuring processes, it is determined whether each measuring process is scheduled for executing at a respective target rate. In response to determining that a particular measuring process of the measuring processes is not scheduled for executing at a particular target rate, resource allocation to at least one monitored process running at a particular level of the priority levels is adjusted. The at least one monitored process is not any of the measuring processes.
Data source: USPTO (United States Patent and Trademark Office) public patent records. Weekly synchronization. How IDiyas builds this profile