The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.
The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.
Patent No.:
Date of Patent:
Jan. 29, 2013
Filed:
Feb. 23, 2010
Shinichiro Chikada, Kanagawa, JP;
Shinichiro Chikada, Kanagawa, JP;
Sony Corporation, Tokyo, JP;
Abstract
A testing apparatus includes a vector memory unit storing original test vector data in which an input signal to be inputted to a circuit subjected to inspection is described, a vector generator generating generated test vector data from the original test vector data, an output part outputting test vector data to be inputted to the inspected circuit, a fault occurrence rate memory unit storing a fault occurrence rate of the input signal, a random number generator generating random number data, and a comparison part comparing the fault occurrence rate of the input signal with the random number data. The vector output part outputs the generated test vector data when the random number data is smaller than the fault occurrence rate of the input signal, and outputs the original test vector data when the random number data is larger than the fault occurrence rate of the input signal.
Data source: USPTO (United States Patent and Trademark Office) public patent records. Weekly synchronization. How IDiyas builds this profile