The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.

The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.

Patent No.:

US 8365027 B1

PDF
Full Text
Expired
Date of Patent:
Jan. 29, 2013

Filed:

Dec. 01, 2009
Applicant:

Masahiro Yanagida, Kawasaki, JP;

Inventor:

Masahiro Yanagida, Kawasaki, JP;

Assignee:

Fujitsu Limited, Kawasaki-Shi, JP;

Attorney:
Primary Examiner:
Int. Cl.
CPC ...
G11C 29/00 (2006.01);
U.S. Cl.
CPC ...
Abstract

A processor includes an arithmetic device, a storage device that holds arithmetic data, a data generator that generates test data, an address generator that generates an address at which the test data is to be written, a test data number counter that counts a number of test data, an error information holder that holds mismatch error information, an error occurrence bit position holder that holds a position of a bit at which a mismatch error has occurred, an error occurrence test data number holder that holds number of test data counted by the test data number counter, and a comparator that compares test data written to the storage device with test data read from the storage device and stores error information in the error information holder and a position of a bit and number of the test data in which the mismatch error has occurred.


Find Patent Forward Citations

Yanagida, Masahiro. (2013). Processor and method for controlling storage-device test unit (U.S. Patent No. 8365027). U.S. Patent and Trademark Office. https://idiyas.com/patent/badge/8365027

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