The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.

The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.

Patent No.:

US 8364735 B1

PDF
Full Text
Expired
Date of Patent:
Jan. 29, 2013

Filed:

Oct. 16, 2008
Applicant:

Hideaki Nakakita, Kanagawa, JP;

Inventor:

Hideaki Nakakita, Kanagawa, JP;

Assignee:
Attorney:
Primary Examiner:
Assistant Examiner:
Int. Cl.
CPC ...
G06F 7/58 (2006.01); G06F 1/02 (2006.01);
U.S. Cl.
CPC ...
Abstract

Random numbers output from a random-number generation circuit, for which an optimized control parameter is set, at a predetermined timing after power-on reset are obtained after each power-on reset, by repeating the power-on reset with respect to a system LSI for a preset number of times, and a test of the obtained predetermined number of random numbers is performed by using a test circuit incorporated in the system LSI to determine the quality of the random-number generation circuit incorporated in the system LSI.


Find Patent Forward Citations

Nakakita, Hideaki. (2013). Test method of integrated circuit with random-number generation circuit and integrated circuit with random-number generation circuit (U.S. Patent No. 8364735). U.S. Patent and Trademark Office. https://idiyas.com/patent/badge/8364735

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