The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.

The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.

Patent No.:

US 8364691 B1

PDF
Full Text
Expired
Date of Patent:
Jan. 29, 2013

Filed:

Mar. 25, 2011
Applicants:

Sean P. Kennedy, Ontario, CA;

Peter A. Nicholls, Ontario, CA;

David A. Salinas, Ontario, CA;

Jonathan E. P. Tzanakakis, Ontario, CA;

Inventors:

Sean P. Kennedy, Ontario, CA;

Peter A. Nicholls, Ontario, CA;

David A. Salinas, Ontario, CA;

Jonathan E. P. Tzanakakis, Ontario, CA;

Attorneys:
Primary Examiner:
Int. Cl.
CPC ...
G06F 7/00 (2006.01);
U.S. Cl.
CPC ...
Abstract

A method of creating and maintaining debug points in an integrated development environment (IDE) includes receiving a first query at a computing device coupled to the IDE, the first query identifying one or more actions; searching the source code with the computing device to locate locations where the one or more actions occur; forming an initial result set that includes locations of the one or more actions; receiving a desired behavior action for some or all of the locations; associating the initial result set and the desired behavior actions to form a first mapping; and storing the mapping and the first query as a first dynamic query based debug point map.


Find Patent Forward Citations

Kennedy, Sean. (2013). Dynamic query-based debug point mapper (U.S. Patent No. 8364691). U.S. Patent and Trademark Office. https://idiyas.com/patent/badge/8364691

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