The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.
The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.
Patent No.:
Date of Patent:
Jan. 29, 2013
Filed:
Feb. 16, 2012
Applicant:
Charles E. Ramberg, Los Altos Hills, CA (US);
Inventor:
Charles E. Ramberg, Los Altos Hills, CA (US);
Assignee:
Other;
Attorney:
Primary Examiner:
Int. Cl.
CPC ...
G06F 17/00 (2006.01);
U.S. Cl.
CPC ...
Abstract
Various aspects provide for receiving data associated with a plurality of samples. A sample generally includes data associated with one or more events. One or more traits may be determined, where a trait may be a set of or associated with one or more events. Generally, events included in a trait may be correlated (including anti-correlated) in some way. A trait may be associated with a sample, and the association may be recorded, an action may be triggered, and/or a user may be notified.
Ramberg, Charles. (2013). Determining traits from sample events (U.S. Patent No. 8364622). U.S. Patent and Trademark Office. https://idiyas.com/patent/badge/8364622
Data source: USPTO (United States Patent and Trademark Office) public patent records. Weekly synchronization. How IDiyas builds this profile