The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.
The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.
Patent No.:
Date of Patent:
Jan. 29, 2013
Filed:
Nov. 23, 2005
Sandeep Dutta, Waukesha, WI (US);
Jianying LI, New Berlin, WI (US);
John Howard Londt, Delafield, WI (US);
Melissa L. Vass, Milwaukee, WI (US);
Xiangyang Tang, Waukesha, WI (US);
Darin R. Okerlund, Muskego, WI (US);
Jiang Hsieh, Brookfield, WI (US);
Elisabeth Angelos, Hartland, WI (US);
Sandeep Dutta, Waukesha, WI (US);
Jianying Li, New Berlin, WI (US);
John Howard Londt, Delafield, WI (US);
Melissa L. Vass, Milwaukee, WI (US);
Xiangyang Tang, Waukesha, WI (US);
Darin R. Okerlund, Muskego, WI (US);
Jiang Hsieh, Brookfield, WI (US);
General Electric Company, Schenectady, NY (US);
Abstract
Methods and systems for generating computed tomographic (CT) images from image data acquired during different biological cycles are provided. A computer is programmed to receive a plurality of scan data acquired during a gated acquisition window of each of a plurality of biological cycles, blend the scan data acquired during a first of the plurality of biological cycles with the scan data acquired during a second of the plurality of biological cycles, and construct a final image from the blended data.