The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.

The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.

Date of Patent:
Jan. 29, 2013

Filed:

May. 20, 2009
Applicants:

Paul Stanley Addison, Edinburgh, GB;

James Nicholas Watson, Dunfermline, GB;

Braddon M. Van Slyke, Arvada, CO (US);

Inventors:

Paul Stanley Addison, Edinburgh, GB;

James Nicholas Watson, Dunfermline, GB;

Braddon M. Van Slyke, Arvada, CO (US);

Assignee:

Nellcor Puritan Bennett Ireland, Mervue, Galway, unknown;

Attorney:
Primary Examiner:
Int. Cl.
CPC ...
A61B 5/00 (2006.01); A61B 5/02 (2006.01); A61B 5/08 (2006.01); G01N 33/48 (2006.01); G01N 33/50 (2006.01);
U.S. Cl.
CPC ...
Abstract

According to embodiments, estimated values for a signal transform may be generated using estimated values for the signal. Signal parameters may then be determined based on the estimated signal transform. A first portion of a signal may be obtained. A second portion of the signal may be estimated. The second portion of the signal may correspond to a portion of the that is unknown, that is not yet available and/or that is obscured by noise and/or artifacts. A transform (e.g., a continuous wavelet transform) of both of the signal portions may be performed. One or more parameters corresponding to the signal may then be determined from transformed signal.


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