The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.
The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.
Patent No.:
Date of Patent:
Jan. 29, 2013
Filed:
Apr. 19, 2011
Applicant:
Yo Imaizumi, Tokyo, JP;
Inventor:
Yo Imaizumi, Tokyo, JP;
Assignee:
Canon Kabushiki Kaisha, Tokyo, JP;
Attorney:
Primary Examiner:
Int. Cl.
CPC ...
G06K 9/40 (2006.01);
U.S. Cl.
CPC ...
Abstract
There is a situation in that, although a speckle interference optical system is effective for clarification of a process of deformation of a specimen, resolution is insufficient, and execution of a phase shift method for improving the resolution involves a costly apparatus. A phase shift image for an initial fringe pattern is acquired, and a phase variation between phase information on an initial image and a next image is derived by a phase shift method. After that, a phase shift image for the next image is computed by calculation based on the acquired information.