The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.

The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.

Date of Patent:
Jan. 29, 2013

Filed:

Sep. 24, 2009
Applicants:

Qiong Liu, Milpitas, CA (US);

Hironori Yano, Tokyo, JP;

Inventors:

Qiong Liu, Milpitas, CA (US);

Hironori Yano, Tokyo, JP;

Assignees:
Attorney:
Primary Examiner:
Int. Cl.
CPC ...
G06K 9/00 (2006.01);
U.S. Cl.
CPC ...
Abstract

System and method of generating feature descriptors for image identification. Input image is Gaussian-blurred at different scales. A difference of Gaussian space is obtained from differences of adjacent Gaussian-blurred images. Key points are identified in the difference-of-Gaussian space. For each key point, primary sampling points are defined with three dimensional relative positions from key point and reaching into planes of different scales. Secondary sampling points are identified for each primary sampling point. Secondary image gradients are obtained between an image at a primary sampling point and images at secondary sampling points corresponding to this primary sampling point. Secondary image gradients form components of primary image gradients at primary sampling points. Primary image gradients are concatenated to obtain a descriptor vector for input image. Descriptor vector thus obtained is scale invariant and requires a number of additions equal to number of primary sampling points multiplied by a number of secondary sampling points.


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