The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.
The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.
Patent No.:
Date of Patent:
Jan. 29, 2013
Filed:
Mar. 21, 2006
Oren Boiman, Tel-Aviv, IL;
Michal Irani, Rehovot, IL;
Oren Boiman, Tel-Aviv, IL;
Michal Irani, Rehovot, IL;
Yeda Research & Development Co. Ltd., Rehovot, IL;
Abstract
Method and apparatus for inferring irregularities in query data relative to referential data includes attempting to compose the query data, like a puzzle, from large chunks of the referential data, and inferring irregularities in the query data based on at least the size of the matching chunks. The larger the size of a matching chunk, the more likely it is that its corresponding region in the query data is valid and not irregular. Regions in the query data which cannot be composed from the referential data, or can only be composed using small fragmented pieces and not large chunks of the referential data, are considered irregular. The method and apparatus is applicable to all types of signals, including images, video data, medical data, one-dimensional signals and multi-dimensional signals, and can be used to identify, inter alia, suspicious behaviors, suspicious objects, irregular patterns and defects in goods.