The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.

The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.

Date of Patent:
Jan. 29, 2013

Filed:

Aug. 06, 2009
Applicants:

Xinhua Sam He, Zionsville, IN (US);

Clayton L. Nicholas, Indianapolis, IN (US);

Inventors:

Xinhua Sam He, Zionsville, IN (US);

Clayton L. Nicholas, Indianapolis, IN (US);

Assignee:

Delphi Technologies, Inc., Troy, MI (US);

Attorney:
Primary Examiner:
Int. Cl.
CPC ...
G06K 9/62 (2006.01);
U.S. Cl.
CPC ...
Abstract

An image classification system configured to classify a target and method thereof is provided, wherein the system includes at least one light source configured to emit light with at least one line pattern towards the target, wherein at least a portion of the emitted light and line pattern is reflected by the target. The system further includes an imager configured to receive at least a portion of the reflected light and line pattern, such that an obtained 2-D line pattern is produced that is representative of at least a portion of the emitted light and line pattern reflected by the target, and a controller configured to compare the 2-D line pattern to at least one previously obtained 2-D line pattern stored in a database, such that the controller classifies the 2-D line pattern as a function of the comparison.


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