The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.

The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.

Date of Patent:
Jan. 29, 2013

Filed:

Oct. 14, 2009
Applicants:

Jiahua Fan, Waukesha, WI (US);

Naveen Chandra, Kenosha, WI (US);

Andrew Johnson, Milwaukee, WI (US);

Jiang Hsieh, Brookfield, WI (US);

Fang Dong, Solon, OH (US);

Mary Sue Kulpins, Brookfield, WI (US);

Peter Crandall, Oconomowoc, WI (US);

Inventors:

Jiahua Fan, Waukesha, WI (US);

Naveen Chandra, Kenosha, WI (US);

Andrew Johnson, Milwaukee, WI (US);

Jiang Hsieh, Brookfield, WI (US);

Fang Dong, Solon, OH (US);

Mary Sue Kulpins, Brookfield, WI (US);

Peter Crandall, Oconomowoc, WI (US);

Assignee:

General Electric Company, Schenectady, NY (US);

Attorney:
Primary Examiner:
Int. Cl.
CPC ...
G06K 9/00 (2006.01); A61B 6/00 (2006.01); H05G 1/64 (2006.01);
U.S. Cl.
CPC ...
Abstract

A CT system includes a generator configured to energize an x-ray source to a first kilovoltage (kVp) and to a second kVp, and a computer that is programmed to acquire a first view dataset with the x-ray source energized to the first kVp and a second view dataset with the x-ray source energized to the second kVp, generate a base correction image using the first view dataset and the second view dataset, and reconstruct a pair of base material images from the first view dataset and from the second view dataset. The computer is also programmed to estimate artifact correlation in the pair of base material images using the base correction image, generate a pair of final base material images and a final monochromatic image, and correct one of the pair of final base material images and the final monochromatic image at a keV value using the estimated artifact correlation.


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