The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.

The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.

Date of Patent:
Jan. 29, 2013

Filed:

Apr. 23, 2008
Applicants:

Masayo Kato, Yokohama, JP;

Koichi Nittoh, Yokohama, JP;

Hitoshi Sakai, Yokohama, JP;

Chikara Konagai, Yokohama, JP;

Katsumi Hosaka, Chigasaki, JP;

Inventors:

Masayo Kato, Yokohama, JP;

Koichi Nittoh, Yokohama, JP;

Hitoshi Sakai, Yokohama, JP;

Chikara Konagai, Yokohama, JP;

Katsumi Hosaka, Chigasaki, JP;

Assignee:
Attorney:
Primary Examiner:
Int. Cl.
CPC ...
G01N 23/06 (2006.01); G01N 23/04 (2006.01); G06K 9/00 (2006.01);
U.S. Cl.
CPC ...
Abstract

A nondestructive identification device includes: a radiation sourceirradiating an x-rayto a standard samplemade of a known material and a sample; a sensordetecting a radiation ray having transmitted the standard sampleand the sample; a signal processing deviceconverting a signal of the sensorinto an image; an image processing devicewhich performs adjustment on an entire second image to make a luminance value of a part of the standard samplein the obtained image or a relation between the luminance value and a thickness of the standard samplein a first image where the energy of the radiation sourceis first energy be the same as that in the second image where the energy of the radiation sourceis second energy, and which performs a computation processing to take a difference or a ratio between the adjusted second image and the first image; and a display devicedisplaying an image.


Find Patent Forward Citations

Loading…