The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.
The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.
Patent No.:
Date of Patent:
Jan. 29, 2013
Filed:
Jul. 01, 2010
Yoshihiro Akimoto, Chiba, JP;
Shoei Kobayashi, Kanagawa, JP;
Motoshi Ito, Osaka, JP;
Yasumori Hino, Nara, JP;
Hiroyasu Inoue, Nagano, JP;
Harukazu Miyamoto, Tokyo, JP;
Koichiro Nishimura, Kanagawa, JP;
Sung-hee Hwang, Suwon-si, KR;
In-oh Hwang, Seongnam-si, KR;
Yoshihiro Akimoto, Chiba, JP;
Shoei Kobayashi, Kanagawa, JP;
Motoshi Ito, Osaka, JP;
Yasumori Hino, Nara, JP;
Hiroyasu Inoue, Nagano, JP;
Harukazu Miyamoto, Tokyo, JP;
Koichiro Nishimura, Kanagawa, JP;
Sung-hee Hwang, Suwon-si, KR;
In-oh Hwang, Seongnam-si, KR;
Sony Corporation, Tokyo, JP;
Panasonic Corporation, Kadoma-shi, JP;
TDK Corporation, Tokyo, JP;
Hitachi Consumer Electronics Co., Ltd., Tokyo, JP;
Samsung Electronics Co., Ltd., Suwon-si, KR;
Abstract
The present invention is to realize a proper inner zone layout in an optical disk having at least three layers. A test area is provided in the inner zone (inner circumference side area) in each of recording layers. The test areas of each layer are so disposed as to be prevented from overlapping with each other in the layer direction. Furthermore, the number of management information recording/reproduction areas overlapping with the test area in the layer direction at a position closer to the laser-incident surface than this test area is set equal to or smaller than one in each test area of each recording layer. The management information recording/reproduction areas are each so disposed as to be prevented from overlapping with the test areas in the respective recording layers in the layer direction on the disk substrate side of the test areas.