The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.
The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.
Patent No.:
Date of Patent:
Jan. 29, 2013
Filed:
Apr. 12, 2011
Isao Kobayashi, Osaka, JP;
Harumitsu Miyashita, Nara, JP;
Isao Kobayashi, Osaka, JP;
Harumitsu Miyashita, Nara, JP;
Panasonic Corporation, Osaka, JP;
Abstract
According to the present invention, a first error pattern caused by a shift of a bit relating to a recording mark or a space of a shortest length and a second error pattern caused by an edge shift of the recording mark are used. For each of a plurality of error patterns, a pattern shift obtained by normalizing a difference between a square of a Euclidean distance between the error pattern and a reproduction signal and a square of a Euclidean distance between a correct pattern and the reproduction signal, using a square of a Euclidean distance between the correct pattern and the error pattern is detected. Length and phase errors are calculated by a sum of, or a difference between, a first pattern shift amount obtained by normalization performed using the first error pattern and a second pattern shift amount obtained by normalization performed using the second error pattern.