The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.

The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.

Date of Patent:
Jan. 29, 2013

Filed:

Oct. 31, 2008
Applicants:

Krishnan Kumaran, Raritan, NJ (US);

Jingbo Wang, New York, NY (US);

Inventors:

Krishnan Kumaran, Raritan, NJ (US);

Jingbo Wang, New York, NY (US);

Assignee:
Attorney:
Primary Examiner:
Int. Cl.
CPC ...
G01V 1/00 (2006.01);
U.S. Cl.
CPC ...
Abstract

A computer implemented method for the detection of features such as faults or channels in seismic images. First, edges are detected in a smoothed seismic image (). To detect a fault line, an image intensity of the edges is projected in multiple spatial directions, for example by performing a Radon transform (). The directions of maximum intensity are used to define a fault line (). To detect channels, smooth curves are identified within the detected edges (). Sets of parallel smooth curves () are then identified and used to define channels ().


Find Patent Forward Citations

Kumaran, Krishnan. (2013). Detection of features in seismic images (U.S. Patent No. 8363510). U.S. Patent and Trademark Office. https://idiyas.com/patent/badge/8363510

Data source: USPTO (United States Patent and Trademark Office) public patent records. Weekly synchronization. How IDiyas builds this profile

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