The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.
The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.
Patent No.:
Date of Patent:
Jan. 29, 2013
Filed:
Sep. 11, 2007
Eva Wagner, Bad-Dürkheim, DE;
Thomas Brinz, Bissingen, DE;
Thomas Geiger, Walddorfhaeslach, DE;
Jane Lewis, Wales, GB;
Markus Tiefenbacher, Fellbach-Schmiden, DE;
Tobias Burk, Tuebingen, DE;
Sebastian Koltzenburg, Dannstadt, DE;
Wolfgang Schrof, Neuleiningen, DE;
Eva Wagner, Bad-Dürkheim, DE;
Thomas Brinz, Bissingen, DE;
Thomas Geiger, Walddorfhaeslach, DE;
Jane Lewis, Wales, GB;
Markus Tiefenbacher, Fellbach-Schmiden, DE;
Tobias Burk, Tuebingen, DE;
Sebastian Koltzenburg, Dannstadt, DE;
Wolfgang Schrof, Neuleiningen, DE;
Robert Bosch GmbH, Stuttgart, DE;
BASF AG, Ludwigshafen, DE;
Abstract
A method is provided for detecting not fully set coatings and liquid or smearing impurities on a surface, in which in a first step a film is pressed onto a surface of a coating using a predefined press-on pressure, the film having a relative motion with respect to the surface of the coating, thereafter the film is pulled off the surface of the coating and finally it is determined whether impurities are adhering to the film. A device is also provided for performing the method, including at least one film, which may be pressed against a surface to be tested, at least one press-on roller having a surface by which the film is pressed against the coating, and at least one device for determining whether there are impurities adhering to the film.