The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.

The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.

Date of Patent:
Jan. 29, 2013

Filed:

Nov. 30, 2009
Applicant:

Kouji Fujiyoshi, Tokyo, JP;

Inventor:

Kouji Fujiyoshi, Tokyo, JP;

Assignee:

Olympus Corporation, Tokyo, JP;

Attorney:
Primary Examiner:
Int. Cl.
CPC ...
H04N 5/253 (2006.01);
U.S. Cl.
CPC ...
Abstract

A microscope system for obtaining an image having a wide view angle by repeatedly capturing an image with an objective lens having a high magnification while moving a stage, and by connecting captured images having a small view angle including a stage, a stage driving unit, a stage position detecting unit, an image capturing unit, a position to be reached determining unit for determining a position to be reached which is the next image capturing position of the stage on the basis of the state of the captured image and the position of the stage at which the image is captured, and a stage move guiding unit for prompting a user to move the stage to the position to be reached on the basis of the detected position of the stage and the determined position to be reached.


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